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Publications

NIST Authors in Bold

Displaying 26 - 50 of 51933

Photorealistic full-color nanopainting enabled by a low-loss metasurface

Author(s)
Pengcheng Huo, Maowen Song, Wenqi Zhu, Cheng Zhang, Lu Chen, Henri J. Lezec, Yanqing Lu, Amit K. Agrawal, Ting Xu
We design and experimentally demonstrate a TiO2 metasurface that enables full-color generation and ultrasmooth color brightness variations. The reproduced

Users Guide to the HVACSIM+ Configuration Tool

Author(s)
Michael A. Galler
HVACSIM+ (HVAC SIMulation PLUS other systems) was introduced by the National Institute of Standards and Technology (NIST) in 1985 as a computer simulation tool

The Next Generation of Current Measurement for Ionization Chambers

Author(s)
Ryan P. Fitzgerald, Denis E. Bergeron, Dean G. Jarrett, Neil M. Zimmerman, Carine Michotte, Hansjoerg Scherer, Stephen Giblin, Steven Judge
Re-entrant ionization chambers (ICs) are essential to radionuclide metrology and nuclear medicine for maintaining standards and measuring half-lives. Metrology

Cutting to Measure the Elasticity and Fracture of Soft Gels

Author(s)
Teresa T. Duncan, Joel M. Sarapas, Adrian P. Defante, Kathryn L. Beers, Edwin P. Chan
The fracture properties of very soft and/or brittle materials are challenging to measure directly due to the limitations of existing fracture testing methods

Evaluating Unicast and MBSFN in Public Safety Networks

Author(s)
Chunmei Liu, Chen Shen, Jack Chuang, Richard A. Rouil, Hyeong-Ah Choi
Public safety incidents typically involve a significant amount of group traffic and have a stringent requirement of connection reliability. Hence multicast

Industrial Wireless Deployments in the Navy Shipyard

Author(s)
Richard Candell, Karl R. Montgomery, Yongkang Liu, Mohamed T. Hany
The National Institute of Standards and Technology (NIST) and the Office of Naval Research (ONR) have partnered to investigate the application of digital

Graphene quantum Hall effect devices for AC and DC resistance metrology

Author(s)
Mattias Kruskopf, Dinesh K. Patel, Chieh-I Liu, Albert F. Rigosi, Randolph E. Elmquist, Yicheng Wang, Stefan Bauer, Yefei Yin, Klaus Pierz, Eckard Pesel, Martin Goetz, Jurgen Schurr
The frequency dependence of the quantized Hall resistance at alternating current results from capacitive losses inside the sample as well as between the sample
Displaying 26 - 50 of 51933