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Publications

NIST Authors in Bold

Displaying 626 - 650 of 51214

Social and Economic Components of Resilient Multi-Hazard Building Design

Author(s)
Katherine J. Johnson, Juan F. Fung, Siamak Sattar, Christopher L. Segura, Therese P. McAllister, Steven L. McCabe
In 2017, U.S. damages from natural hazard events exceeded $300B, suggesting that current targets for building performance do not sufficiently mitigate loss. The

Ultrathin Wetting Layer-Free Plasmonic Gold Films

Author(s)
Robert Lemasters, Cheng Zhang, Manoj Manjare, Wenqi Zhu, Junyeob Song, Sergei Urazhdin, Henri J. Lezec, Amit K. Agrawal, Hayk Harutyunyan
Ultrathin gold films are attractive for plasmonic and metamaterial devices, thanks to their useful optical and optoelectronic properties. However, deposition of

Calibration

Author(s)
Lane C. Sander
In the context of chemical metrology, calibration is the process of relating a known quantity of an analyte to the corresponding measured instrumental response

Wireless User Requirements for the Factory Workcell

Author(s)
Karl R. Montgomery, Richard Candell, Yongkang Liu, Mohamed T. Hany
Wireless communication is becoming crucial to advanced manufacturing. Industry 4.0 and Smart Manufacturing depend on networked industrial automation systems

Simulation of Copper Electrodeposition in Through-Hole Vias

Author(s)
Trevor M. Braun, Daniel Josell, Thomas P. Moffat, Jimmy John
Copper electrodeposition processes for filling metallized through-hole (TH) and through-silicon vias (TSV) depend on selective breakdown of a co-adsorbed

Characterizing LTE User Equipment Emissions: Factor Screening

Author(s)
Jason B. Coder, Adam J. Wunderlich, Michael R. Frey, Paul Blanchard, Daniel G. Kuester, Azizollah Kord, Max Lees, Aric W. Sanders, Jolene D. Splett, Lucas N. Koepke, Robert D. Horansky, Duncan A. McGillivray, John M. Ladbury, Jeffrey T. Correia, Venkatesh Ramaswamy, Jerediah Fevold, Shawn Lefebre, Jacob K. Johnson, John Carpenter, Mark Lofquist, Keith Hartley, Melissa M. Midzor
Characterizations of long-term evolution (LTE) user equipment (UE) emissions are a key ingredient in models of interference between wireless cellular networks

Study of the neutron spin-orbit interaction in silicon

Author(s)
Thomas R. Gentile, Michael G. Huber, Muhammad D. Arif, Daniel S. Hussey, David L. Jacobson, Donald D. Koetke, Murray Peshkin, Thomas Dombeck, Paul Nord, Dimitry A. Pushin, Robert Smither
The neutron spin-orbit interaction, which results from the interaction of a moving neutron's magnetic dipole moment (MDM) with the atomic electric elds, induces
Displaying 626 - 650 of 51214