NIST Authors in Bold
Displaying 626 - 650 of 674 Si Resonant Interband Tunnel Diodes Grown by Low-Temperature Molecular Beam Epitaxy
P E. Thompson, K D. Hobart, M E. Twigg, G Jernigan, T E. Dillon, S L. Rommel, P R. Berger, David S. Simons, P Chi, R Lake, A C. Seabaugh
Development of a Triplasmatron Ion Source for the Generation of SF5+ and F- Primary Ion Beams on an Ion Microscope Secondary Ion Mass Spectrometry Instrument
John G. Gillen, R L. King, F Chmara
Elemental and Molecular Imaging of Human Hair Using Secondary Ion Mass Spectrometry
John G. Gillen, S V. Roberson, C M. Ng, M Stranick
Fractal Dimension of Particle Outlines: Meaning, Utility, Limitations, Standard Images and Examples
David S. Bright
The Formation of Abrupt n+ Doping Profiles Using Atomic Hydrogen and Sb During Si MBE
P E. Thompson, C Silvestre, M E. Twigg, G Jernigan, David S. Simons
The Southern California Ozone Study 97 Radiocarbon Experiment
George A. Klouda, C. W. Lewis, J L. Marolf, D C. Stiles, K G. Kronmiller, K D. Oliver, J R. Adams
Preliminary Evaluation of an SF5+ Polyatomic Primary Ion Beam for Analysis of Organic Thin Films by Secondary Ion Mass Spectrometry
John G. Gillen, S V. Roberson
Standard Test Data for Estimating Peak Parameter Errors in X-Ray Photoelectron Spectroscopy: I. Results for Peak Binding Energies
Joseph M. Conny, Cedric J. Powell, Lloyd A. Currie
Quantitative secondary ion mass spectrometry imaging of self-assembled monolayer films for electron beam dose mapping in the environmental scanning electron microscope
John G. Gillen, Scott A. Wight, David S. Bright, T M. Herne
Atomic Hydrogen for the Formation of Abrupt Sb Doping Profiles in MBE-Grown Si
P E. Thompson, C Silvestre, M E. Twigg, G Jernigan, David S. Simons
Comparison of Semiconductor Pixel Array, Phosphor Plate, and Track-Etch Detectors for Alpha Autoradiography
Cynthia J. Zeissler
Effect of Ge on the Segregation of B in Si(100) and Si(110)
P E. Thompson, C Silvestre, G Jernigan, K D. Hobart, David S. Simons, M Gregg
Dynamics and Free Energy of Polymers Partitioning into a Nanoscale Pore
S. M. Bezrukov, I Vodyanoy, R A. Brutyan, J. J. Kasianowicz
Microhotplate Chemical Vapor Deposition in the Environmental SEM Chamber
Scott A. Wight, Richard E. Cavicchi, M J. Nystrom, F DiMeo
Measurement of ESEM Electron Beam Profiles with Self-Assembled Monolayers and SIMS
Scott A. Wight, G Gillen, T M. Herne
SIMS Imaging of Electron Beam Scattering in the Environmental SEM
Scott A. Wight, G Gillen, T M. Herne
Development of Environmental Scanning Electron Microscopy Electron Beam Profile Imaging with Self-Assembled Monolayers and Secondary Ion Mass Spectroscopy
Scott A. Wight, G Gillen, T M. Herne
Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS
Scott A. Wight, G Gillen, T M. Herne
The Scanning Scattering Microscopy for Surface and Buried Interface Roughness and Defect Imaging
J Lorincik, J Fine, John G. Gillen
Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region
G Redmond, C Gilles, M Fialin, O Rouer, Ryna B. Marinenko, Robert L. Myklebust, Dale E. Newbury
Carbonization Rate of Soot Precursor Particles
R A. Dobbins, G J. Govatzidakis, W Lu, A F. Schwartzman, Robert A. Fletcher