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NIST Authors in Bold

Displaying 1 - 25 of 74713

The Enhanced Gain Extrapolation Technique

November 6, 2026
Author(s)
Joshua Gordon, Benjamin Moser
We present an overview on a recently developed technique for performing antenna gain measurements with gain extrapolation that uses significantly fewer data points and at shorter distances than traditional gain extrapolation. This enhanced technique

Linear Rail Kinematic Calibration using a Legendre Polynomial Model

November 4, 2026
Author(s)
Benjamin Moser, Joshua Gordon, Andrew J. Petruska
Linear motion components are widely used in antenna metrology positioning systems, but long motion ranges can reduce positioning accuracy due to the difficulty of eliminating rail component non-linearity. Further, offset device-under-test (DUT) mounting

Traceable Validation of Calculable Quantum-Based RF Waveforms

November 4, 2026
Author(s)
Jeremy Thomas, Nathan Flowers-Jacobs, Anna Fox, Johannes Hoffmann, Paul Dresselhaus
We compare the calculated, quantum-based output of a radio-frequency Josephson arbitrary waveform synthesizer (RF-JAWS) with its measured output that is calibrated through the established NIST RF power traceability path, a necessary first step towards

NIST Workshop on SI Incident Management

November 2, 2026
Author(s)
M S Raunak, Sanjay Rekhi, Alexander Nelson, Peter Cihon, Anita Rao
The NIST Workshop on SI Incident Management convened over 400 experts across government, frontier-model developers, cloud and cybersecurity providers, academia, standards organizations, and civil society to examine how organizations can prepare for, detect

Small Business Cybersecurity: Non-Employer Firms

November 2, 2026
Author(s)
Daniel Eliot, Jeffrey Marron, Savann Thorn
This report is designed to help small businesses use the NIST Cybersecurity Framework (CSF) 2.0 [1] to manage their cybersecurity risks. The document is tailored to the smallest of businesses — those with no employees other than the owner, or "non-employer

Research Challenges in Industrial Technology and Impediments to its Adoption

October 27, 2026
Author(s)
Chuck Werner, William Harrison, Pavlo Piliptchak
New technology understood and implemented by industry is responsible for many of the improvements to our daily lives. The creation of new technology is a non-linear cycle born of necessity and incremental progress. Industry creates its own new technology

Transition to Post-Quantum Cryptography Standards

October 27, 2026
Author(s)
Dustin Moody, Ray Perlner, Angela Robinson, Andrew Regenscheid, David Cooper
This report describes NIST's approach to transitioning from quantum-vulnerable cryptographic algorithms to post-quantum digital signature algorithms and key-establishment schemes. It identifies existing quantum-vulnerable cryptographic standards and the

Conversion of Reported Temperatures from Historical Scales to the ITS-90

October 26, 2026
Author(s)
Allan Harvey
While the International Temperature Scale of 1990 (ITS-90) has been a standard for many years, there is a large amount of historical thermophysical data reported on other scales. The differences of these scales from ITS-90 is typically small, but not

Advanced Sensors for Multi-Color Infrared Imaging Bolometers

October 23, 2026
Author(s)
Christopher Yung, Glen Wurden
A new form of infrared imaging bolometer (IRIB) suitable for radiometric imaging of high temperature plasmas is presented offering several key advantages: instantaneous power read-out via an IR camera (within thermal timescale constraints), increased

Strain-Induced Interfacial Bond Evolution and Facet-Dependent Strain Response of Electronic Properties in Oxidized Silicon Nanowires

October 19, 2026
Author(s)
Yasir Mahmood, Daniel Wines, Viviana Faride Dovale Farelo, Kamal Choudhary, Lucas Hale
Silicon nanowires (Si NWs) have emerged as promising candidates for next-generation nanoelectronic devices due to their tunable electronic properties, and compatibility with aggressive scaling requirements. The integration of strain further enhances their

Recommended Second Virial Coefficients for Nitrogen and Oxygen

October 15, 2026
Author(s)
Robert Hellmann, Giovanni Garberoglio, Allan Harvey
We provide recommended values for the second virial coefficient, B(T), and its uncertainty, for molecular nitrogen and oxygen. The temperature range covered is 20-3000 K for nitrogen and 20-2000 K for oxygen. The recommendations are based on tuning

Noise Based Power Calibration Techniques for Mid-band Radio Frequency Sensors

October 13, 2026
Author(s)
Aric Sanders, Todd Schumann, Dazhen Gu, Michael Forsyth, Xifeng Lu
This technical report details approaches to the amplitude calibration and noise character- ization of frequency dependent power detection in the 1-6 GHz range using noise with a known power spectral density. The noise is generated by a commercial off the

Validation of upgrades to the NIST M48 vision measurement system

October 8, 2026
Author(s)
Maxwell Praniewicz, John Stoup, Wei Ren
One-dimensional and two-dimensional vision artifacts are calibrated at NIST using the Dimensional Metrology Group's M48 vision measurement system. The vision system replaces the tactile probing system on the primary M48 CMM (coordinate measurement machine)

BACnet Device Emulator Users' Guide

October 7, 2026
Author(s)
Michael Galler, Amanda Pertzborn, Parastoo Delgoshaei
The BACnet Device Emulator (BDE) is a tool built to help accelerate the development of Digital Twins in the built environment. By creating emulated BACnet subnets and controllers it enables testing and development to occur in a realistic manner.

Improved Correlations for the Static Dielectric Constant of Hydrogen

October 7, 2026
Author(s)
Guinevere Sellner, Liam Tenardi, Paul Stanwix, Eric May, Allan Harvey
Accurate values of the static dielectric constant of hydrogen are important for both fundamental thermophysical property calculations and emerging dielectric-based sensing applications in hydrogen liquefaction, storage, and processing systems. Previous

Value Assignment of Reference Material 8404 Almond Flour for Allergen Detection

October 7, 2026
Author(s)
Melissa Phillips, David Bunk, Ashley Green, James Yen
The National Institute of Standards and Technology (NIST) recently released RM 8404 Almond Flour for Allergen Detection, which is intended for harmonizing measurements of allergenic proteins in foods. The material was purchased from a commercial vendor and

Value Assignment of Reference Material 8405 Hazelnut Flour for Allergen Detection

October 7, 2026
Author(s)
Melissa Phillips, David Bunk, Ashley Green, James Yen
The National Institute of Standards and Technology (NIST) recently released RM 8405 Hazelnut Flour for Allergen Detection, which is intended for harmonizing measurements of allergenic proteins in foods. The material was purchased from a commercial vendor
Displaying 1 - 25 of 74713
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