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Displaying 76 - 78 of 78

Microwave Evaluation of Electromigration Susceptibility in Advanced Interconnects

November 1, 2017
Author(s)
Yaw S. Obeng, Kin P. Cheung, Dmitry Veksler, Christopher E. Sunday
Traditional metrology has been unable to adequately address the needs of emerging integrated circuits (ICs) at the nano scale; thus, new metrology and techniques are needed. For example, the reliability challenges in fabrication need to be well understood

Modeling Performance Measurement of Mobile Manipulators

August 3, 2017
Author(s)
Roger V. Bostelman, Sebti Foufou, Tsai H. Hong
Mobile manipulators are being marketed around the world as single manufacturer systems (i.e., robot arm and vehicle manufactured by the same organization) and as independent robot arms, from a different manufacturer and integrated with automatic guided

Mobile Manipulator Performance Measurement Data

June 27, 2017
Author(s)
Roger V. Bostelman, YaShian Li-Baboud, Steven Legowik, Tsai H. Hong, Sebti Foufou
The National Institute of Standards and Technology, Intelligent Systems Division has collected data detailing the performance measurement of a mobile manipulator, i.e., an automatic guided vehicle (AGV) with onboard robot arm from two different
Displaying 76 - 78 of 78
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