Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

Search Title, Abstract, Conference, Citation, Keyword or Author

Advanced search

Title

Author

NIST Pub Series

NIST Topic Areas

Report Number

Publication Date

NIST Authors in Bold

Displaying 62401 - 62425 of 74498

Magnetic-Field-Modulated Written Bits in TbFeCo Thin Films: Transmission Electron Microscopy Lorentz and Scanning Electron Microscopy with Polarization Analysis Studies

January 1, 1990

Author(s)

M Aeschlimann, M Scheinfein, john unguris

Material Dependence of Electron Inelastic Mean Free Paths at Low Energies

January 1, 1990

Author(s)

Shigeo Tanuma, Cedric J. Powell, David R. Penn

We have calculated electron inelastic mean free paths (IMFPs) for 50-2000 eV electrons in 31 materials (27 elements and 4 compounds). We present and discuss in this paper IMFP data for aluminum and gold in the 50-2000 ev Range. Substantial differences are

Materials reliability, technical activities 1991:

January 1, 1990

Author(s)

H I McHenry, C M Fortunko

Materials studies for magnetic fusion energy applications at low temperatures - XIII:

January 1, 1990

Author(s)

R L Tobler, R P Reed

Measurement of electric field strength near higher powered personal transceivers:

January 1, 1990

Author(s)

John Adams, Doris Wu, Alan Budlong

Measurement Standards to Support Photonics Technology

January 1, 1990

Author(s)

Douglas L. Franzen

Measuring the extent of rust on steel after abrasive blasting::a feasibility study

January 1, 1990

Author(s)

Mary E McKnight, Dale P Bentz, Willard Roberts

Mechanical properties and fracture toughness of AAR TC128 grade B steel and micro-alloyed, control-rolled steel, A 8XX grade B, from -80[degrees] F to + 73[degrees] F:

January 1, 1990

Author(s)

G E Hicho, J H Smith

Message handling systems interoperability tests:

January 1, 1990

Author(s)

Carol A Edgar

Metallurgy, technical activities 1991:

January 1, 1990

Author(s)

E N Pugh, J H Smith

Metrology for electromagnetic technology ::a bibliography of NIST publications

January 1, 1990

Author(s)

Mary E DeWeese

Metrology for space power::metrology development and survey of space-based measurements

January 1, 1990

Author(s)

G J FitzPatrick, J K Olthoff, E D Simmon, C P Jr Fenimore

Micromagnetic calculations of 180[degree] surface domain wall magnetization profiles with comparison to measurements:

January 1, 1990

Author(s)

James L Blue, M R Scheinfein

Miniature Surveillance Recorders,? Natl. Inst. of Justice, U. S. Dept. of Justice| NIJ Standard 0226.00, 23 pages (Jan 1990).

January 1, 1990

Author(s)

P. M. Fulcomer

MIS capacitor studies on silicon carbide single crystals::final report for May 8, 1989 to November 8, 1989

January 1, 1990

Author(s)

J J Kopanski

Models of transport processes in concrete:

January 1, 1990

Author(s)

James M Pommersheim, James R Clifton

Modern test methods for flammability:

January 1, 1990

Author(s)

Vytenis Babrauskas

Molecular Ion Imaging and Dynamic Secondary Ion Mass Spectrometry Analysis of Organic Compounds

January 1, 1990

Author(s)

John G. Gillen, David S. Simons, P. Williams

An ion microscope equipped with a resistive anode encoder imaging system has been used to acquire molecular secondary ion images, with lateral resolutions on the order of 1 μm, from several quaternary ammonium salts an amino acid, and a polynuclear