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Displaying 58476 - 58500 of 74229

The Design of an Atomic Force Microscope for Metrology

January 1, 1994
Author(s)
T Mcwaid, J Schneir
Atomic force microscope (AFM) is a rapidly evolving technique which has been used in numerous academic studies since its invention eight years ago. AFM manufacturers are now marketing instruments for industrial metrology applications. The National

The Development of a Calibrated Atomic Force Microscope

January 1, 1994
Author(s)
T Mcwaid, J Schneir
Advances in the manufacture of integrated circuits, x-ray optics, magnetic read-write heads, optical data storage media, razor blades, etc. require advances in ultraprecision metrology. Each of these industries is currently investigating the use of Atomic

The Gaseous Electronics Conference radio-frequency reference cell: a defined parallel-plate radio-frequency system for experimental and theoretical studies of plasma processing discharges

January 1, 1994
Author(s)
P J. Hargis, Jr, K E. Greenberg, P A. Miller, J B. Gerardo, J R. Torczynski, M E. Riley, G A. Hebner, J R. Roberts, James K. Olthoff, J R. Whet-stone, R R. Van brunt, M A. Sobolewski, H M. Anderson, M P. Splichal, J L. Mock, P Bletzinger, A Garscadden, R A. Gottscho, G Selwyn, M Dalvie, J E. Heidenreich, J W. Butter-baugh, M L. Brake, M L. Passow, J Pender, A Lujan, M E. Elta, D Graves, H H. Sawin, M J. Kuschner, J T. Verdeyen, R Horwath, T R. Turner

The Geometric Characterization of Rockwell Diamond Indenters

January 1, 1994
Author(s)
Jun-Feng Song, F Rudder, Theodore V. Vorburger, A Hartman, Brian R. Scace, J Smith
By using a stylus instrument, a series of calibration and check standards, and calibration and uncertainty calculation procedures, we have calibrated Rockwell diamond indenters with a traceability to fundamental measurements. The combined measurement

The Growth of Iron on Iron Whiskers

January 1, 1994
Author(s)
Joseph A. Stroscio, Daniel T. Pierce
Real space views of the homoepitaxial growth of Fe on Fe(001) whiskers is reported, observed by scanning tunneling microscopy (STM), during the initial stages of growth. Scaling of the Fe island sizes and separation distributions are observed as a function

The International Standard of Length

January 1, 1994
Author(s)
Dennis A. Swyt
This chapter discusses the modern concept of traceability as it applies to CMM measurements of manufactured parts. It shows the means by which those dimensional measurements are functionally related to the international standard of length, the various
Displaying 58476 - 58500 of 74229
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