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Displaying 526 - 550 of 5222

CERTIFICATION OF SRM 640f LINE POSITION AND LINE SHAPE STANDARD FOR POWDER DIFFRACTION

May 31, 2020
Author(s)
David R. Black, Marcus Mendenhall, Albert Henins, James Filliben, James Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of instrument performance of both X-ray and neutron powder diffractometers. This report describes SRM

Improvised Long Test Lengths via Stitching Scale Bar Method: Performance Evaluation of Terrestrial Laser Scanners per ASTM E3125-17

May 28, 2020
Author(s)
Shendong Shi, Balasubramanian Muralikrishnan, Vincent Lee, Daniel S. Sawyer, Octavio Icasio-Hern?ndez
Periodic performance evaluation is a critical issue for ensuring the reliability of data from terrestrial laser scanners (TLSs). With the recent introduction of the ASTM E3125-17 standard, there now exist standardized test procedures for this purpose

Dual Josephson impedance bridge: towards a universal bridge for impedance metrology

May 19, 2020
Author(s)
Frederic Overney, Nathan Flowers-Jacobs, Blaise Jeanneret, Alain Rufenacht, Anna Fox, Paul Dresselhaus, Samuel Benz
This paper presents a full characterization of a Dual Josephson Impedance Bridge (DJIB) at frequencies up to 80kHz by using the DJIB to compare the best available impedance standards that are (a) directly traceable to the quantum Hall effect, (b) used as

Basic Metrology for 2020

April 30, 2020
Author(s)
Stephan Schlamminger, Richard Davis
2019 was a big year for Metrology. The international system of units was revised on World Metrology Day, May 20th, that year [1]. What will 2020 bring? In this article we discuss five promising advances that we have on a watchlist for 2020. First, we

Single-Photon Sources: Approaching the Ideal through Multiplexing

April 30, 2020
Author(s)
Alan L. Migdall, Evan Meyer-Scott, Christine Silberhorn
We review the rapid recent progress in single-photon sources based on multiplexing multiple probabilistic photon-creation events. Such multiplexing allows higher single-photon probabilities and lower contamination from higher-order photon states. We study

Preface: Uncertainty Evaluation by Monte Carlo Method

March 16, 2020
Author(s)
Prem Rachakonda, Vishal Ramnath, Vinay Shankar Pandey
Measurement uncertainty is a parameter that is used to characterize the dispersion of the values attributed to a measurand. There are multiple definitions of measurement uncertainty that were adopted by various international working groups. The differences

Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

March 12, 2020
Author(s)
Ann C. Chiaramonti Debay, Luis Miaja Avila, Benjamin W. Caplins, Paul T. Blanchard, Norman A. Sanford, Brian Gorman, David R. Diercks
This paper reports construction of an extreme ultraviolet (EUV) radiation-triggered atom probe tomograph and describes the results from initial experiments on amorphous SiO2. Femtosecond-pulsed coherent EUV radiation of 29.6 nm wavelength (41.85 eV photon

Quantities and Units for Software Product Measurements

March 10, 2020
Author(s)
David W. Flater
International Organization for Standardization (ISO)/International Electrotechnical Commission (IEC) 80000, the International System of Quantities, collects and organizes the most important physical quantities into a coherent system. In a similar fashion

SI Base Units Relationships Poster

March 3, 2020
Author(s)
Eite Tiesinga, Kristen A. Dill, David B. Newell
This publication is a colorful poster illustrating the relationships of the International System of Units (SI) derived units with special names and symbols and the seven traditional base units. The diagram is aligned with the BIPM SI Brochure, 9th edition
Displaying 526 - 550 of 5222
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