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Search Publications

NIST Authors in Bold

Displaying 47826 - 47850 of 73830

On Weakly Analytic and Faithfully Convex Functions in Convex Programming

June 1, 2000
Author(s)
G P. McCormick, Christoph J. Witzgall
Weakly-analytic convex, faithfully convex, and self-concordant functions are considered, and their relationships described. The purpose of the report is to state and provide complete proofs of results that illustrate circumstances under which weak

Optical Fiber Power Meter Calibrations at NIST

June 1, 2000
Author(s)
Igor Vayshenker, Xiaoyu X. Li, David J. Livigni, Thomas Scott, Christopher L. Cromer
NIST has established measurement services for the calibration of optical fiber power meters at the three nominal wavelengths of 850, 1300, and 1550 nm using either collimated beam or optical fiber/connector configurations. This paper describes the

Parallel Genetic Programming

June 1, 2000
Author(s)
John G. Hagedorn, J E. Devaney
This project is developing a generic Genetic Programming system that is inherently parallel. Genetic Programming uses Darwinian selection and reproduction to evolve a solution to a problem, where individuals are represented by computer programs. A user

Phase-Tailoring Molecular Wave Packets to Time-Shift Their Dynamics

June 1, 2000
Author(s)
Z Amitay, J B. Ballard, H U. Stauffer, S R. Leone
Time-shifting (up to a global arbitrary phase) of the dynamics of molecular wave packets, i.e., |dielectric flux}(t)> -> | dielectric flux} (t-t shift)>, is demonstrated using a high degree of state-selective coherent phase control with shaped femtosecond

Realistic Sampling-Circuit Model for a Nose-to-Nose Simulation

June 1, 2000
Author(s)
Catherine A. Remley, Dylan F. Williams, Donald C. DeGroot
We extend previously developed oscilloscope sampler models to include realistic circuit characteristics and use these models to investigate the nose-to-nose calibration technique.

Recent Progress in Nanoscale Indentation of Polymers Using the AFM

June 1, 2000
Author(s)
Mark R. VanLandingham, John S. Villarrubia, G F. Meyers
Regardless of the type of test, reliable indentation measurements require knowledge of the shape of the indenter tip. For indentation measurements involving sub-micrometer scale contacts, accurate knowledge of the tip shape can be difficult to achieve. In

Selected Programs at the New SURF III Electron Storage Ring

June 1, 2000
Author(s)
Mitchell L. Furst, Uwe Arp, G P. Cauchon, A D. Hamilton, L R. Hughey, Thomas B. Lucatorto, Charles S. Tarrio
The conversion of the electron storage ring at NIST (the National Institute of Standards and Technology) to SURF III (the Synchrotron Ultraviolet Radiation Facility) has resulted in a significant improvement to the azimuthal uniformity of magnetic field as

Structural Studies of Pulsed-Laser-Deposited Ba 4 Fe 4 Ti 3 0 16 Oxide Films

June 1, 2000
Author(s)
Leonid A. Bendersky, R Maier, J L. Cohn, J J. Neumeier
In this paper the pulsed laser deposition on single-crystal Mg0 substrates of Ba(sub4)Fe(sub4)Ti(sub3)0(sub16) target has been studied by TEM and x-ray diffraction. For [100] and [111] orientations of the substrate, the initial stage of the deposition

Superconductor Measurement Techniques and Cryostat Design

June 1, 2000
Author(s)
John (Jack) W. Ekin
This introduction to measurement cryostat design includes illustrations of several practical cryostats for testing low-current thin-films and high-current bulk superconductors. Heat transfer is the heart of most cryostat designs and illustrative

The Approaching Revolution in X-Ray Microanalysis: The Microcalorimeter Energy Dispersive Spectrometer

June 1, 2000
Author(s)
Dale E. Newbury, David A. Wollman, Gene C. Hilton, Kent D. Irwin, Norman F. Bergren, David A. Rudman, John M. Martinis
We have developed a high-resolution energy-dispersive x-ray spectrometer (EDS) based on cryogenic microcalorimeter x-ray detectors for use in x-ray microanalysis. With an energy resolution of 3 eV at 1.5 keV, count rate of {approximately} 500 s -1, and an

The Effect of an Oxidized Gold Substrate on Alkanethiol Self-Assembly

June 1, 2000
Author(s)
John T. Woodward IV, Marlon L. Walker, Curtis W. Meuse, David J. Vanderah, G Poirier, Anne L. Plant
UV cleaned gold substrates incubated in solutions of alkanethiol show islands on the monolayer surface when imaged with non-contact atomic force microscopy (AFM). The height of the islands above the monolayer is approximately twice the height of the

The Neolithography Consortium

June 1, 2000
Author(s)
James E. Potzick
The role of process simulation in microlithography is becoming an increasingly important part of process control as wafer feature sizes become smaller than the exposure wavelength, because the pattern transfer from photomask to wafer is nonlinear. An
Displaying 47826 - 47850 of 73830
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