U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 46076 - 46100 of 74178

Low Voltage Microanalysis using Microcalorimeter EDS

January 1, 2001
Author(s)
David A. Wollman, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Norman F. Bergren, Steven Deiker, John M. Martinis, Martin Huber, Dale Newbury
We present the current performance of the prototype high-resolution microcalorimeter energy-dispersive spectrometer (υcal EDS) developed at NIST for x-ray microanalysis. In particular, the low-energy υcal EDS designed for operation in the energy range from

Magnetic Anisotropy and Thermal Stability of Ta-pinned Spin Valves

January 1, 2001
Author(s)
R A. Fry, Robert D. McMichael, John E. Bonevich, P J. Chen, William F. Egelhoff Jr., Chang H. Lee
It has recently been found that large uniaxial anisotropy fields in excess of 120 kA/m (1500 Oe) can be created in thin (3 nm to 5 nm) films of Co by obliquely sputtered Ta underlayers. This anisotropy can be used to pin the bottom film of a spin valve

Magnetic Combinatorial Thin-Film Libraries

January 1, 2001
Author(s)
Stephen E. Russek, William E. Bailey, G A. Alers
Magnetic combinatorial libraries have been fabricated to investigate complex magnetic thin-film systems and to provide test systems to develop on-wafer metrologies. The use of combinatorial materials techniques is a new and powerful method to develop and

Magnetic Trapping of Ultracold Neutrons

January 1, 2001
Author(s)
C R. Brome, J S. Butterworth, K Coakley, Maynard S. Dewey, S N. Dzhosyuk, R G. Golub, K Habicht, P R. Huffman, Steve K. Lamoreaux, C E. Mattoni, D N. McKinsey, Fred E. Wietfeldt, John M. Doyle

Materials Reliability Division FY 2000 Programs and Accomplishments

January 1, 2001
Author(s)
F R. Fickett
The technical activities of the Materials Reliability Division during fiscal year 2000 are summarized. The Division has 23 research projects in the following eight program areas: Materials for Microelectronics (4): Materials for Wireless Communication (5)

Mathematics and Measurement

January 1, 2001
Author(s)
Ronald F. Boisvert, Michael J. Donahue, Daniel W. Lozier, Robert D. McMichael, Bert W. Rust
In this paper we describe the role that mathematics plays in measurement science at NIST. We first survey the history behind NIST's current work in this area, starting with the NBS Math Tables project of the 1930s. We then provide examples of more recent

Measurement Considerations for the Determination of Central Plant Efficiency

January 1, 2001
Author(s)
Stephen J. Treado, Todd W. Snouffer
Concerns about maintaining optimum operating conditions for central plants in order to minimize energy usage and cost have highlighted the need for accurate measruements of electrical power, fluid flow and temperature chillers and boilers. In particular
Displaying 46076 - 46100 of 74178