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Displaying 42951 - 42975 of 143797

Surface conduction of topological Dirac electrons in bulk insulating Bi2Se3

April 15, 2012
Author(s)
Dohun Kim, Sungjae Cho, Nicholas P. Butch, Paul Syers, Kevin Kirshenbaum, Shaffique Adam, Johnpierre Paglione, Michael S. Fuhrer
The newly-discovered three-dimensional strong topological insulators (STIs) exhibit topologically-protected Dirac surface states. While the STI surface state has been studied spectroscopically by e.g. photoemission and scanned probes, transport experiments

Structured Water in Polyelectrolyte Dendrimers: Understanding Small Angle Neutron Scattering Results through Atomistic Simulation

April 14, 2012
Author(s)
Bin Wu, Boutheina Kerkeni, Takeshi Egami, Changwoo Do, Yun Liu, Yongmei Wang, Lionel Porcar, Kunlun Hong, Sean C. Smith, Emily L. Liu, Gregory S. Smith, Wei-Ren Chen
Based on atomisitc dynamics (MD)simulations, small angle neutron scattering (SANS)intensity behavior of single generation 4 9G$) polyelectrolyte polyamidoamine starburst dendrimer (PAMAM) dendrimer is investigate at different levels of molecular

High-Accuracy Measurement of Atomic Polarizability in an Optical Lattice Clock

April 13, 2012
Author(s)
Jeffrey A. Sherman, Nathan D. Lemke, Nathan M. Hinkley, M. Pizzocaro, Richard W. Fox, Andrew D. Ludlow, Christopher W. Oates
Presently, the Stark effect contributes the largest source of uncertainty in a ytterbium optical atomic clock through blackbody radiation. By employing an ultracold, trapped atomic ensemble and high stability optical clock, we characterize the quadratic

Nanoscale Fullerene Compression of an Yttrium Carbide Cluster

April 13, 2012
Author(s)
Jianyuan Zhang, Fuhrer Tim, Wujun Fu, Jiechao Ge, Dan Bearden, Jerry Dallas, Duchamp James, Kenneth Walker, Hunter Champion, Hugo Azurmendi, Kim Harich, Harry C. Dorn
The encapsulation of clusters (or small molecules) in spheroidal fullerene cages provides a unique isolated environment that is important in describing their shape, dynamics, and physical properties. For the case of yttrium carbide clusters, we find that

Battery Discharge Characteristics of Wireless Sensors in Building Applications

April 11, 2012
Author(s)
Wenqi Guo, William M. Healy, Mengchu Zhou
Sensor nodes in wireless networks often use batteries as their source of energy, but replacing or recharging exhausted batteries in a deployed network can be difficult and costly. Therefore, prolonging battery life becomes a principal objective in the

Ultimate bending strength of Si nanowires

April 11, 2012
Author(s)
Gheorghe Stan, Sergiy Krylyuk, Albert Davydov, Igor Levin, Robert F. Cook
Test platforms for the ideal strength of materials are provided by almost defect-free nanostructures (nanowires, nanotubes, nanoparticles, for example). In this work, the ultimate bending strengths of Si nanowires with radii in the 20 nm to 60 nm range

Carbon Storage Properties of OMS-2 Manganese Oxide

April 10, 2012
Author(s)
Lan (. Li, Eric J. Cockayne, Laura Espinal, Winnie K. Wong-Ng
Manganese oxide OMS-2 material, also known as alpha-MnO2, exhibits CO2 sorption hysteresis at pressures > 7 bar. Our experiments show that the hysteretic behavior strongly depends on time, temperature and pressure. To understand the atomic structures and

Membrane Association of the PTEN Tumor Suppressor: Molecular Details of the Protein-Membrane Complex from SPR Binding Studies and Neutron Reflection

April 10, 2012
Author(s)
Siddharth Shenoy, Prabhanshu Shekhar, Frank Heinrich, Maria-Claire Daou, Arne Gericke, Alonzo H. Ross, Mathias Loesche
The structure and function of the PTEN phosphatase is investigated by studying its membrance affinity and localization on in-plane fluid, thermally disordered synthetic membrane models. The membrane association of the protein depends strongly on membrane

Patterned Defect & CD Metrology by TSOM Beyond the 22 nm Node

April 10, 2012
Author(s)
Ravikiran Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to the nanometer level by combining two-dimensional optical images captured at several through

Residual Layer Thickness Control and Metrology in Jet and Flash Imprint Lithography

April 10, 2012
Author(s)
Ravikiran Attota, Shrawan Singhal, Sreenivasan S.V.
Jet-and-Flash Imprint Lithography (J-FIL) has demonstrated capability of high-resolution patterning at low costs. For accurate pattern transfer using J-FIL, it is imperative to have control of the residual layer thickness (RLT) of cured resist underneath
Displaying 42951 - 42975 of 143797
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