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NIST Authors in Bold

Displaying 33926 - 33950 of 73697

Piezoelectric Trace Vapor Calibrator

August 1, 2006
Author(s)
R M. Verkouteren, John G. Gillen, David Taylor
The design and performance of a vapor generator for calibration and testing of trace chemical sensors are described. The device utilizes piezoelectric nozzles to dispense and vaporize precisely known amounts of analytic solutions onto a hot ceramic surface

Polycrystalline Patterns in Far-From-Equilibrium Freezing: A Phase Field Study

August 1, 2006
Author(s)
L Granasy, T Pusztai, T Borzsonyi, G Toth, G -. Tegze, James A. Warren, Jack F. Douglas
We discuss the formation of polycrystalline microstructures with the framework of phase field theory. First, the model is tested for crystal nucleation in a hard sphere system. It is shown that, when evaluating the model parameters from molecular dynamics

R-22 Replacement Status (In Spanish)

August 1, 2006
Author(s)
J M. Calm, Piotr A. Domanski
Since its initial recognition in 1928 and commercialization in 1936, R-22 has been applied in systems ranging from the smallest window air conditioners to the largest chillers and heat pumps, including those for district cooling and heating. Individual

Screening Candidates for 30 nm Spheres

August 1, 2006
Author(s)
Michelle K. Donnelly, Jiann C. Yang
This paper describes the preliminary screening process that was conducted to identify potential candidate particles to be used as the NIST Standard Reference Material (SRM) 30 nm spheres. Five different samples were obtained and measured using the NIST

Second Symposium on Pendulum Impact Machines: Procedures and Specimens

August 1, 2006
Author(s)
Thomas A. Siewert, Christopher N. McCowan, M. P. Manahan
This publication consists primarily of the papers presented at the Second Symposium on Pendulum Impact Machines: Procedures and Specimens, sponsored by ASTM Committee E28 on Mechanical Testing and its Subcommittee E28.07 on Impact Testing. The Symposium

Standards in Gene Expression Microarray Experiments

August 1, 2006
Author(s)
Marc L. Salit
The use of standards in gene expression measurements with DNA microarrays is ubiquitous—they just are not yet the kind of standards that have yielded microarray gene expression profiles that can be readily compared across different studies and different

Temperature and Pressure Coefficients of Thomas 1 Ohm Resistors

August 1, 2006
Author(s)
George R. Jones Jr., Randolph Elmquist
In preparing to move the precision 1 ohm measurement service to the new Advanced Measurement Laboratory (AML) in the spring of 2004, staff at the National Institute of Standards and Technology (NIST) first assembled a second precision 1 ohm measurement

The Evaluation of Ontologies

August 1, 2006
Author(s)
Leo Obrst, Benjamin Ashpole, Werner Ceusters, Mahesh Mani, Steven R. Ray, Bradford Smith
Recent years have seen rapid progress in the development of ontologies as semantic models intended to capture and represent aspects of the real world. There is, however, great variation in the quality of ontologies. If ontologies are to become

The LAGR Project. Integrating learning into the 4D/RCS Control Hierarchy

August 1, 2006
Author(s)
James S. Albus, Roger V. Bostelman, Tsai H. Hong, Tommy Chang, William P. Shackleford, Michael O. Shneier
The National Institute of Standards and Technology?s (NIST) Intelligent Systems Division (ISD) is a par-ticipant in the Defense Advanced Research Project Agency (DARPA) LAGR (Learning Applied to Ground Robots) Project. The NIST team?s objective for the

Three-Flat Test Solutions based on Simple Mirror Symmetry

August 1, 2006
Author(s)
Ulf Griesmann
Three-flat tests are the archetypes of measurement procedures used in interferometric surface and wavefront metrology to separate errors in the interferometer reference wavefront from errors due to the tests part surface, so-called absolute tests. A new

PIV Data Model Test Guidelines

July 31, 2006
Author(s)
Ramaswamy Chandramouli, Ketan Mehta, Pius A. Uzamere, Davie Simon, Nabil Ghadiali, Andrew P. Founds
In order to build the necessary PIV infrastructure to support common unified processes and government-wide use of identity credentials, NIST developed this test guidance document that ensures interoperability of PIV data. This document provides test

Depth Profiling Using C 60 + SIMS Deposition and Topography Development During Bombardment of Silicon

July 30, 2006
Author(s)
John G. Gillen, J Batteas, Chris A. Michaels, P Chi, John A. Small, Eric S. Windsor, Albert J. Fahey, Jennifer R. Verkouteren, W Kim
A C60+ primary ion source has been coupled to an ion microscope SIMS instrument to examine sputtering of silicon with an emphasis on possible application of C60+ depth profiling for high depth resolution SIMS analysis of silicon semiconductor materials
Displaying 33926 - 33950 of 73697
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