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Displaying 53376 - 53400 of 74474

Ferromagnetic Resonance Linewidth in Thin Films Coupled to NiO

January 1, 1998
Author(s)
Robert McMichael, Mark D. Stiles, P J. Chen, William F. Egelhoff Jr.
The out-of-plane angular dependence of the ferromagnetic resonance linewidth, Δ H is described by nearly angle-independent damping parameters. In the NiO-coupled films, however, the damping was found to depend strongly on magnetization orientation, with
Displaying 53376 - 53400 of 74474
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