Dagata, J.
and Kopanski, J.
(1995),
Scanning Probe Techniques for the Electrical Characterization of Semiconductor Devices, Solid State Technology
(Accessed May 7, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Scanning Probe Techniques for the Electrical Characterization of Semiconductor Devices
Published
Author(s)
,
Citation
Solid State Technology
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 30, 1995, Updated October 12, 2021