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Scanning Nanobeam Electron Diffraction for Atom Probe Tomography

Published

Author(s)

Megan Holtz, Andrew Herzing, Brian Gorman
Citation
Microscopy and Microanalysis

Citation

Holtz, M. , Herzing, A. and Gorman, B. (2023), Scanning Nanobeam Electron Diffraction for Atom Probe Tomography, Microscopy and Microanalysis, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936601 (Accessed May 19, 2024)

Issues

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Created July 22, 2023, Updated August 2, 2023