Holtz, M.
, Herzing, A.
and Gorman, B.
(2023),
Scanning Nanobeam Electron Diffraction for Atom Probe Tomography, Microscopy and Microanalysis, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936601
(Accessed November 6, 2024)