Heinrich, K.
(1965),
Scanning electron probe microanalysis.:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.278
(Accessed December 5, 2024)
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Scanning electron probe microanalysis.:
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- NBS TN 278
Report Number
NBS TN 278
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NIST Pubs
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Created January 1, 1965, Updated May 19, 2023