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Scanning Electron Microscopy with Secondary Electron Spin Polarization Analysis: A New Probe of Magnetic Microstructure

Published

Author(s)

John Unguris, G Hembree, Daniel T. Pierce, Robert Celotta
Conference Dates
January 1, 1985
Conference Location
Milwaukee, WI, USA
Conference Title
45th Annual Conference on Physical Electronics

Citation

Unguris, J. , Hembree, G. , Pierce, D. and Celotta, R. (1985), Scanning Electron Microscopy with Secondary Electron Spin Polarization Analysis: A New Probe of Magnetic Microstructure, 45th Annual Conference on Physical Electronics, Milwaukee, WI, USA (Accessed April 19, 2024)
Created December 31, 1984, Updated October 12, 2021