The scanning electron microscopy with polarization analysis (SEMPA) technique as a means of observing magnetic microstructure is surveyed. A brief description of the technique is given. Particular emphasis is paid to the spin-polarization detector as the critical element in the SEMPA system.
Proceedings Title: NSF/CNRS Workshop on Electron Beam Induced High Spatial Resolution Spectroscopies
Conference Dates: February 28-March 5, 1988
Conference Location: Aussois, France
Pub Type: Conferences
ELECTRON, SPECTROSCOPIES, SPECTROSCOPY