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Scanning electron microscope examination of wire bonds from high-reliability devices:

Published

Author(s)

Kathryn O Leedy
Citation
- NBS TN 785
Report Number
NBS TN 785

Citation

Leedy, K. (1973), Scanning electron microscope examination of wire bonds from high-reliability devices:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.785 (Accessed February 26, 2024)
Created January 1, 1973, Updated May 19, 2023