Postek, M.
(1989),
Scanning Electron Microscope-Based Metrological Electron Microscope System and New Prototype SEM Magnification Standard, Scanning Microscopy
(Accessed July 18, 2025)
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Scanning Electron Microscope-Based Metrological Electron Microscope System and New Prototype SEM Magnification Standard
Published
Author(s)
Citation
Scanning Microscopy
Volume
3
Issue
4
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 31, 1989, Updated February 17, 2017