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Scanning Electron Microscope-Based Metrological Electron Microscope System and New Prototype SEM Magnification Standard

Published

Author(s)

Michael T. Postek
Citation
Scanning Microscopy
Volume
3
Issue
4

Citation

Postek, M. (1989), Scanning Electron Microscope-Based Metrological Electron Microscope System and New Prototype SEM Magnification Standard, Scanning Microscopy (Accessed April 14, 2024)
Created December 31, 1989, Updated February 17, 2017