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Scanned Probe Microscopy of YBa2Cu3Ox Thin-Film Device Structures on Si Substrates

Published

Author(s)

John M. Moreland, Todd E. Harvey, Ronald H. Ono, Alexana Roshko
Citation
IEEE Transactions on Applied Superconductivity
Volume
3(1)

Citation

Moreland, J. , Harvey, T. , Ono, R. and Roshko, A. (1993), Scanned Probe Microscopy of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>x</sub> Thin-Film Device Structures on Si Substrates, IEEE Transactions on Applied Superconductivity (Accessed February 28, 2024)
Created February 28, 1993, Updated October 12, 2021