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PUBLICATIONS

Scanned Probe Microscopy of YBa2Cu3Ox Thin-Film Device Structures on Si Substrates

Published

Author(s)

John M. Moreland, Todd E. Harvey, Ronald H. Ono, Alexana Roshko
Citation
IEEE Transactions on Applied Superconductivity
Volume
3(1)
Pub Type
Journals
Law enforcement

Citation

Moreland, J. , Harvey, T. , Ono, R. and Roshko, A. (1993), Scanned Probe Microscopy of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>x</sub> Thin-Film Device Structures on Si Substrates, IEEE Transactions on Applied Superconductivity (Accessed October 10, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created February 28, 1993, Updated October 12, 2021
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