NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Scanned Probe Microscopy of YBa2Cu3Ox Thin-Film Device Structures on Si Substrates

Published

Author(s)

John M. Moreland, Todd E. Harvey, Ronald H. Ono, Alexana Roshko
Citation
IEEE Transactions on Applied Superconductivity
Volume
3(1)
Pub Type
Journals
Law enforcement

Citation

Moreland, J. , Harvey, T. , Ono, R. and Roshko, A. (1993), Scanned Probe Microscopy of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>x</sub> Thin-Film Device Structures on Si Substrates, IEEE Transactions on Applied Superconductivity (Accessed October 4, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created February 28, 1993, Updated October 12, 2021
Was this page helpful?