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Resolution of a Discrepancy of X-Ray Attenuation Measurements of Silicon in the Energy Range 25-50 keV

Published

Author(s)

Christopher T. Chantler
Citation
Journal of Physics-Condensed Matter
Volume
11

Citation

Chantler, C. (1999), Resolution of a Discrepancy of X-Ray Attenuation Measurements of Silicon in the Energy Range 25-50 keV, Journal of Physics-Condensed Matter (Accessed April 24, 2024)
Created January 1, 1999, Updated February 17, 2017