Chantler, C.
(1999),
Resolution of a Discrepancy of X-Ray Attenuation Measurements of Silicon in the Energy Range 25-50 keV, Journal of Physics-Condensed Matter
(Accessed April 22, 2025)
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Resolution of a Discrepancy of X-Ray Attenuation Measurements of Silicon in the Energy Range 25-50 keV
Published
Author(s)
Citation
Journal of Physics-Condensed Matter
Volume
11
Pub Type
Journals
Citation
Issues
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Created January 1, 1999, Updated February 17, 2017