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PUBLICATIONS

The Residual and Temperature-Dependent Resistance of Reference-Grade Platinum Wire Below 13.8 K

Published

Author(s)

Weston L. Tew, William E. Murdock, Michal J. Chojnacky, Dean C. Ripple

Abstract

We report the Residual Resistance Ratio (RRR) and resistance ratio W(GaMP) (gallium melting point) values for well-annealed samples of the original SRM 1967, its contemporary substitute SRM 1967a, and a collection of NIST capsule-type SPRTs. The RRR dependence on annealing temperature is investigated and our results are compared with calculations based on contemporary chemical impurity analyses. The data are corrected to remove temperature-dependent components to derive the RRR at 0 K using W(T) data over the range 1 K
Proceedings Title
Temperature, Its Measurement and Control in Science and Industry
Volume
8
Conference Dates
March 20-23, 2012
Conference Location
Anaheim, CA
Conference Title
9th International Temperature Symposium
Pub Type
Conferences

Download Paper

https://doi.org/10.1063/1.4819584

Keywords

Platinum, Standard Reference Material, Residual Resistance Ratio, Pt-67
Thermometry metrology

Citation

Tew, W. , Murdock, W. , Chojnacky, M. and Ripple, D. (2013), The Residual and Temperature-Dependent Resistance of Reference-Grade Platinum Wire Below 13.8 K, Temperature, Its Measurement and Control in Science and Industry, Anaheim, CA, [online], https://doi.org/10.1063/1.4819584 (Accessed January 19, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 12, 2013, Updated November 10, 2018