Creuziger, A.
and Vaudin, M.
(2011),
Report on VAMAS round robin of ISO 13067 ::microbeam analysis - electron backscatter diffraction - measurement of average grain size, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.7814
(Accessed December 15, 2024)
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Report on VAMAS round robin of ISO 13067 ::microbeam analysis - electron backscatter diffraction - measurement of average grain size
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- NIST IR 7814
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NIST IR 7814
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Created January 1, 2011, Updated May 20, 2023