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Report on the CCT Supplementary Comparison S1 of Infrared Spectral Normal Emittance/Emissivity

Published

Author(s)

Leonard M. Hanssen, Boris Wilthan, Christian Monte, Joerg Hollandt, Jacques Hameury, Jean-Remy Filtz, Ferruccio Girard, Mauro Battuello, Juntaro Ishii

Abstract

The National Measurement Institutes (NMIs) of the United States, Germany, France, Italy and Japan, have joined in an inter-laboratory comparison of their infrared spectral emittance scales. This action is part of a series of supplementary inter-laboratory comparisons (including thermal conductivity and thermal diffusivity) sponsored by the Consultative Committee on Thermometry (CCT) Working Group 9 (WG 9) on Thermophysical Properties. The objective of this collaborative work is to strengthen the major operative National Measurement Institutes’ (NMIs) infrared spectral emittance scales and consequently the consistency of radiative properties measurements carried out worldwide. The comparison has been performed over a spectral range of 2 μm to 14 μm, and a temperature range from 23 °C to 800 °C. Artefacts included in the comparison are potential standards: oxidized inconel, boron nitride, and silicon carbide. The measurement instrumentation and techniques used for emittance scales are unique for each NMI, including the temperature ranges covered as well as the artefact sizes required. For example, all three common types of spectral instruments are represented: dispersive grating monochromator, Fourier transform and filter-based spectrometers
Citation
Metrologia
Volume
53

Keywords

Emittance, Emissivity, Infrared, Standards, Supplementary: Comparison, Spectral

Citation

Hanssen, L. , Wilthan, B. , Monte, C. , Hollandt, J. , Hameury, J. , Filtz, J. , Girard, F. , Battuello, M. and Ishii, J. (2016), Report on the CCT Supplementary Comparison S1 of Infrared Spectral Normal Emittance/Emissivity, Metrologia, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=916434 (Accessed June 20, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created March 15, 2016, Updated February 19, 2017