Dziuba, R.
and Jarrett, D.
(2002),
Report on CCEM-K2 Key Comparison of Resistance Standards at 10 Mohm and 1 Gohm Resistance, Conference Digest, Ottawa, 1, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=1181
(Accessed May 7, 2024)
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Report on CCEM-K2 Key Comparison of Resistance Standards at 10 Mohm and 1 Gohm Resistance
Published
Author(s)
Ronald F. Dziuba,
Abstract
An international comparison of dc resistance at 10 Mohm and 1 GHohm was organized under the auspices of the Consultative Committee for Electricity and Magnetism (CCEM) and piloted by the National Institute of Standards and Technology (NIST) with 14 other national metrology institutes (NMIs) participating. Results from the comparison are reported.Proceedings Title
Conference Digest
Conference Dates
June 16-21, 2002
Conference Location
Ottawa, 1, CA
Conference Title
Conference on Precision Electromagnetic Measurements
Pub Type
Conferences
Download Paper
Keywords
international comparison, national metrology institute, reference value, resistance standards, uncertainty
Citation
Created May 31, 2002, Updated October 12, 2021