Oates, A.
and Cheung, K.
(2017),
Reliability of Nano-Electronic Devices, CHALLENGES IN NANOELECTRONICS, Wiley, Hoboken, NJ
(Accessed December 7, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Reliability of Nano-Electronic Devices
Published
Author(s)
Anthony S. Oates,
Abstract
This is a general overview of reliability challenge of advanced CMOSCitation
CHALLENGES IN NANOELECTRONICS
Publisher Info
Wiley, Hoboken, NJ
Pub Type
Book Chapters
Keywords
CMOS, reliability, front end, back end, scaling
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 31, 2017, Updated October 12, 2021