Oates, A.
and Cheung, K.
(2017),
Reliability of Nano-Electronic Devices, CHALLENGES IN NANOELECTRONICS, Wiley, Hoboken, NJ
(Accessed July 5, 2025)
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Reliability of Nano-Electronic Devices
Published
Author(s)
Anthony S. Oates,
Abstract
This is a general overview of reliability challenge of advanced CMOSCitation
CHALLENGES IN NANOELECTRONICS
Publisher Info
Wiley, Hoboken, NJ
Pub Type
Book Chapters
Keywords
CMOS, reliability, front end, back end, scaling
Citation
Issues
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Created May 31, 2017, Updated October 12, 2021