Oates, A.
and Cheung, K.
(2017),
Reliability of Nano-Electronic Devices, CHALLENGES IN NANOELECTRONICS, Wiley, Hoboken, NJ
(Accessed June 6, 2023)
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Reliability of Nano-Electronic Devices
Published
Author(s)
Anthony S. Oates,
Abstract
This is a general overview of reliability challenge of advanced CMOSCitation
CHALLENGES IN NANOELECTRONICS
Publisher Info
Wiley, Hoboken, NJ
Pub Type
Book Chapters
Keywords
CMOS, reliability, front end, back end, scaling
Citation
Created May 31, 2017, Updated October 12, 2021