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Reliability of Nano-Electronic Devices

Published

Author(s)

Anthony S. Oates, Kin P. Cheung

Abstract

This is a general overview of reliability challenge of advanced CMOS
Citation
CHALLENGES IN NANOELECTRONICS
Publisher Info
Wiley, Hoboken, NJ

Keywords

CMOS, reliability, front end, back end, scaling

Citation

Oates, A. and Cheung, K. (2017), Reliability of Nano-Electronic Devices, CHALLENGES IN NANOELECTRONICS, Wiley, Hoboken, NJ (Accessed April 14, 2024)
Created May 31, 2017, Updated October 12, 2021