Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Recommended electron-impact excitation and ionization cross sections for Be II

Published

Author(s)

DIPTI DIPTI, Christian Hill, Dmitry Fursa, Haadi Umer, Igor Bray, Yuri Ralchenko

Abstract

An overview of the current status of electron-impact excitation and ionization cross sections for Be II is given and the recommended data sets for use in plasma modeling are presented. Accurate cross sections between the lowest 14 atomic terms of 1s2nl (n ≤ 5) configurations are calculated with the convergent close-coupling (CCC) method and compared with the available experimental and theoretical results. The recommended electron-impact excitation and ionization cross sections are represented by analytical fitting functions that preserve correct asymptotic behaviour. Uncertainties in the recommended data sets are determined by assessing the accuracy of the target structures, the convergence in the subsequent collisional calculations, and the fitting method and are well within 15 % for most of the transitions. The fitting coefficients for 91 excitation cross sections and 14 ionization cross sections are provided for use in plasma modeling simulations.
Citation
Atomic Data and Nuclear Data Tables
Volume
156

Keywords

Excitation, ionization, electron impact, Be II, convergent close-coupling

Citation

Dipti, D. , Hill, C. , Fursa, D. , Umer, H. , Bray, I. and Ralchenko, Y. (2024), Recommended electron-impact excitation and ionization cross sections for Be II, Atomic Data and Nuclear Data Tables, [online], https://doi.org/10.1016/j.adt.2023.101634, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956244 (Accessed December 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 9, 2024, Updated July 22, 2024