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Recent Investigations Into the Temperature and Pressure Characteristics of Precision 1 Ohm Resistors at the National Institute of Standards and Technology

Published

Author(s)

George R. Jones Jr., Randolph Elmquist

Abstract

Recent modifications to the precision 1 ohm resistor current comparator systems at the National Institute of Standards and Technology (NIST) allow for improved determination of the temperature and pressure coefficients. This capability allows NIST to better characterize the Thomas resistors used for inter-laboratory comparisons, and will be employed to evaluate the reported specifications of several commercially available precision 1 ohm resistors.
Proceedings Title
Conference on Precision Electromagnetic Measurements Digest
Conference Dates
July 9-14, 2006
Conference Location
Torino, 1, IT
Conference Title
Conference on Precision Electromagnetic Measurements

Keywords

pressure coefficient, standard resistor, temperature coefficient

Citation

Jones Jr., G. and Elmquist, R. (2006), Recent Investigations Into the Temperature and Pressure Characteristics of Precision 1 Ohm Resistors at the National Institute of Standards and Technology, Conference on Precision Electromagnetic Measurements Digest, Torino, 1, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32183 (Accessed June 24, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 30, 2006, Updated October 12, 2021