Jones Jr., G.
and Elmquist, R.
(2006),
Recent Investigations Into the Temperature and Pressure Characteristics of Precision 1 Ohm Resistors at the National Institute of Standards and Technology, Conference on Precision Electromagnetic Measurements Digest, Torino, 1, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32183
(Accessed October 7, 2025)
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Recent Investigations Into the Temperature and Pressure Characteristics of Precision 1 Ohm Resistors at the National Institute of Standards and Technology
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Author(s)
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Abstract
Recent modifications to the precision 1 ohm resistor current comparator systems at the National Institute of Standards and Technology (NIST) allow for improved determination of the temperature and pressure coefficients. This capability allows NIST to better characterize the Thomas resistors used for inter-laboratory comparisons, and will be employed to evaluate the reported specifications of several commercially available precision 1 ohm resistors.Proceedings Title
Conference on Precision Electromagnetic Measurements Digest
Conference Dates
July 9-14, 2006
Conference Location
Torino, 1, IT
Conference Title
Conference on Precision Electromagnetic Measurements
Pub Type
Conferences
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Keywords
pressure coefficient, standard resistor, temperature coefficient
Citation
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Created June 30, 2006, Updated October 12, 2021