Scherschligt, J.
, Fedchak, J.
, Ahmed, Z.
, Barker, D.
, Douglass, K.
, Eckel, S.
, Hanson, E.
, Hendricks, J.
, Purdy, T.
, Ricker, J.
and Singh, R.
(2018),
Quantum-based vacuum metrology at NIST, Journal of Vacuum Science & Technology A, [online], https://doi.org/10.1116/1.5033568
(Accessed December 2, 2024)