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Quantitative Characterization of the Contrast Mechanisms of Ultra-Small Angle-X-Ray Scattering Imaging

Published

Author(s)

F Zhang, Gabrielle G. Long, Lyle E. Levine, Jan Ilavsky, P R. Jemian

Abstract

We offer a general treatment of X-ray imaging contrast for Ultra-Small Angle X-ray Scattering (USAXS) imaging that makes use of phase propagation and dynamic diffraction theory to account quantitatively for the intensity distribution in the detector plane. Simulated results from a model system of micro-sized spherical SiO2 particles embedded in a polypropylene matrix shows good agreement with experimental measurements. Simulations by means of a separate geometrical ray-tracing method also account for the features in the USAXS images and offer a complementary view of small angle X-ray scattering as a contrast mechanism. The ray-tracing analysis indicates the refraction, in the form of Porod scattering, and to a much lesser extent, X-ray reflection, account for USAS imaging contrast.
Citation
Journal of Applied Crystallography

Keywords

phase contrast, ultra-small-angle X-ray scattering, USAXS imaging, X-ray imaging

Citation

Zhang, F. , Long, G. , Levine, L. , Ilavsky, J. and Jemian, P. (2021), Quantitative Characterization of the Contrast Mechanisms of Ultra-Small Angle-X-Ray Scattering Imaging, Journal of Applied Crystallography (Accessed February 27, 2024)
Created October 12, 2021