Quantitative Analysis of Oxidation State in Cerium Oxide Nanomaterials

Published

May 14, 2017

Author(s)

Christopher Sims, Russell Maier, Aaron Johnston-Peck, Justin Gorham, Vincent A. Hackley, Bryant C. Nelson

Abstract

Cerium oxide nanoparticles (nanoceria) are receiving increased attention from the research community due to the large number and wide range of their current and potential applications. The attractiveness of nanoceria for these various applications is rooted in their unique chemical properties, most prominent of which is their ability to alternate between the Ce3+ and Ce4+ oxidation states. While many analytical techniques and methods have been used to characterize the amounts of Ce3+ and Ce4+ present (Ce3+/Ce4+ ratio) within nanoceria materials, very few studies have utilized multiple complementary analytical tools (orthogonal analysis) with technique-independent oxidation state controls for quantitative determinations of the Ce3+/Ce4+ ratio. Use of technique-independent control samples should improve the comparison of oxidation state measurements across a wide range of analytical techniques. Here, we utilize electron energy loss spectroscopy (EELS) and X-ray photoelectron spectroscopy (XPS) to orthogonally characterize the oxidation states of a suite of commercially available nanoceria materials using technique-independent Ce3+ and Ce4+ controls. Similarities and differences between analytical results are discussed in the context of the products analyzed.

Proceedings Title

Technical Proceedings of the 2017 TechConnect World, including the Nanotech 2017 Conference

Conference Dates

May 14-17, 2017

Conference Location

Washington, DC, US

Pub Type

Conferences

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Keywords

ceria nanoparticles, characterization, oxidation state, orthogonal analysis

Citation

Sims, C. , Maier, R. , Johnston-Peck, A. , Gorham, J. , Hackley, V. and Nelson, B. (2017), Quantitative Analysis of Oxidation State in Cerium Oxide Nanomaterials, Technical Proceedings of the 2017 TechConnect World, including the Nanotech 2017 Conference, Washington, DC, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923150 (Accessed March 13, 2025)