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Quantifying Variance Components for Repeated Scattering-Parameter Measurements up to 110 GHz

Published

Author(s)

Jeffrey Jargon, Dazhen Gu, Jerome Cheron, Rob Jones, Amanda Koepke

Abstract

We utilize a Multivariate Analysis of Variance (MANOVA) method to quantify components of variance for scattering-parameter measurements made with a vector network analyzer (VNA). A hierarchical model allows us to estimate the variance components for a device under test (DUT) over multiple calibrations, each with repeated measurements taken amongst a series of disconnections. We present results for experiments performed on a VNA involving WR-28 (26.5 GHz to 40.0 GHz) rectangular waveguide and 1.0 mm coax (200 MHz to 110 GHz). For each case, we compare our overall repeatability with the systematic uncertainties due to mechanical tolerances of the calibration artifacts.
Proceedings Title
Proceedings of the 106th ARFTG Microwave Measurement Symposium
Conference Dates
January 18-21, 2026
Conference Location
Hollywood, CA, US
Conference Title
106th ARFTG Microwave Measurement Symposium

Keywords

Analysis of variance, coaxial, measurement, multivariate, repeatability, scattering parameters, vector network analyzer, waveguide.

Citation

Jargon, J. , Gu, D. , Cheron, J. , Jones, R. and Koepke, A. (2026), Quantifying Variance Components for Repeated Scattering-Parameter Measurements up to 110 GHz, Proceedings of the 106th ARFTG Microwave Measurement Symposium, Hollywood, CA, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=960688 (Accessed May 14, 2026)
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Created January 21, 2026, Updated May 13, 2026
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