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A Pseudo Exhaustive Software Testing Framework for Embedded Digital Devices in Nuclear Power

Published

Author(s)

Athira Jayakumar, D. Richard Kuhn, Brandon Simons, Aidan Collins, Smitha Gautham, Richard Hite, Raghu N. Kacker, Abhi Rajagopala, Carl Elks

Abstract

The major challenge faced by the nuclear industry related to software testing of digital embedded devices is the identification of practical software (SW) testing solutions that provide a strong technical basis and is at the same time effective in establishing credible evidence of software CCF reduction. Towards this effort, we conducted a systematic empirical study on pseudo-exhaustive SW testing methods for embedded digital devices. In this paper, we describe the realization of a testbed for conducting an automated pseudo exhaustive software testing on embedded digital devices and the intricate interactions between the multiple software tools involved in the workflow. The collected results and derived findings confirm the ability of the automated pseudo exhaustive testing methodology to economically exercise the interaction input/state space in a systematic, rigorous, and comprehensive manner.
Proceedings Title
https://www.ans.org/meetings/am2021/search/?q=kuhn
Conference Dates
June 14-17, 2021
Conference Location
virtual, TN, US
Conference Title
2021 American Nuclear Society Virtual Annual Meeting

Keywords

Pseudo-exhaustive testing, t-way combinatorial testing, Nuclear I&C, Smart sensor

Citation

Jayakumar, A. , Kuhn, D. , Simons, B. , Collins, A. , Gautham, S. , Hite, R. , Kacker, R. , Rajagopala, A. and Elks, C. (2021), A Pseudo Exhaustive Software Testing Framework for Embedded Digital Devices in Nuclear Power, https://www.ans.org/meetings/am2021/search/?q=kuhn, virtual, TN, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=932114 (Accessed September 23, 2022)
Created June 14, 2021, Updated February 28, 2022