Huang, H.
and Hedberg Jr., T.
(2019),
Proposed Expansion of Quality Information Framework (QIF) Standard Schema with Potential Failure Mode and Effects Analysis (FMEA) Information Model, Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.AMS.300-7
(Accessed October 13, 2025)
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Proposed Expansion of Quality Information Framework (QIF) Standard Schema with Potential Failure Mode and Effects Analysis (FMEA) Information Model
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Abstract
Potential Failure Mode and Effects Analysis (FMEA) contains a method and the associated information requirements for quality management and risk analysis. FMEA is applicable to manufacturing processes and product design. Quality Information Framework (QIF) is a standard that covers the quality measurement and analysis phase within a model based enterprise (MBE) for manufacturing. An information model, developed in Extensible Markup Language (XML) for FMEA is described in this paper and is proposed to be included as a part of QIF. This paper also identifies key information sharing between FMEA and QIF.Citation
Advanced Manufacturing Series (NIST AMS) - 300-7
Report Number
300-7
NIST Pub Series
Pub Type
NIST Pubs
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Keywords
Extensible Markup Language, FMEA, Failure Mode, Failure Mode and Effects Analysis, Potential Failure Mode, QIF, Quality Information Framework, Risk, risk priority number, RPN, XML, XML Schema Definition, XSD
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Created May 15, 2019, Updated October 12, 2021