Russell, T.
(1982),
Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.81-2413
(Accessed March 13, 2025)
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Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density:
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- NBS IR 81-2413
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NBS IR 81-2413
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NIST Pubs
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Created January 1, 1982, Updated May 19, 2023