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Probing Structural Contributions to Charge Transport Across Ni-Octanedithiol Multilayer Junctions

Author(s)

Lam H. Yu, Christopher D. Zangmeister, James G. Kushmerick

Abstract

We report the fabrication and characterization of multilayer thin films incorporating 1,8-octanedithiols and Ni atoms. Low-temperature charge transport measurements exhibit inelastic co-tunneling and resonant tunneling features that correspond energetically to vibrational excitations of the molecular multilayer. Several junctions exhibit changes in conductance features characteristic of charge defect-gating. Transport through our junctions is shown to be dominatedby the intrinsic properties of the multilayer.
Citation
Nano Letters

Citation

Yu, L. , Zangmeister, C. and Kushmerick, J. (1970), Probing Structural Contributions to Charge Transport Across Ni-Octanedithiol Multilayer Junctions, Nano Letters (Accessed August 9, 2022)
Created August 26, 2016, Updated February 17, 2017