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Probing Structural Contributions to Charge Transport Across Ni-Octanedithiol Multilayer Junctions
Published
Author(s)
Lam H. Yu, Christopher D. Zangmeister, James G. Kushmerick
Abstract
We report the fabrication and characterization of multilayer thin films incorporating 1,8-octanedithiols and Ni atoms. Low-temperature charge transport measurements exhibit inelastic co-tunneling and resonant tunneling features that correspond energetically to vibrational excitations of the molecular multilayer. Several junctions exhibit changes in conductance features characteristic of charge defect-gating. Transport through our junctions is shown to be dominatedby the intrinsic properties of the multilayer.
Citation
Nano Letters
Pub Type
Journals
Citation
Yu, L.
, Zangmeister, C.
and Kushmerick, J.
(2008),
Probing Structural Contributions to Charge Transport Across Ni-Octanedithiol Multilayer Junctions, Nano Letters
(Accessed October 3, 2023)