Probe Segregation and T-g Determination of a Supported Ultra-Thin Polystyrene Film Studied by X-Ray, Neutron Reflectivity, and SIMS
Christopher C. White, Wen-Li Wu, Y Pu, M Rafallovich, J Sokolov
Selective deuteration combined with X-ray and neutron reflectivity has been used to determine the extent of probe segregation to an interface in ultra-thin polymer films as a function of number of thermal cycles. Additional determination of the extent of probe segregation to an interface was shown with SIMS. Significant probe segregation was not evident in these studies. X-Ray reflectivity has also been employed to measure the coefficient of thermal expansion of ultra-thin polystyrene films supported on quartz. The glass transition temperature determined with this method is equivalent to that measured for bulk polystyrene films.
fluorescence, glass-transition temperature, ultra-thin polymer film
, Wu, W.
, Pu, Y.
, Rafallovich, M.
and Sokolov, J.
Probe Segregation and T-g Determination of a Supported Ultra-Thin Polystyrene Film Studied by X-Ray, Neutron Reflectivity, and SIMS, Polymer Engineering and Science, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851807
(Accessed March 3, 2024)