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Probe Segregation and T-g Determination of a Supported Ultra-Thin Polystyrene Film Studied by X-Ray, Neutron Reflectivity, and SIMS

Published

Author(s)

Christopher C. White, Wen-Li Wu, Y Pu, M Rafallovich, J Sokolov

Abstract

Selective deuteration combined with X-ray and neutron reflectivity has been used to determine the extent of probe segregation to an interface in ultra-thin polymer films as a function of number of thermal cycles. Additional determination of the extent of probe segregation to an interface was shown with SIMS. Significant probe segregation was not evident in these studies. X-Ray reflectivity has also been employed to measure the coefficient of thermal expansion of ultra-thin polystyrene films supported on quartz. The glass transition temperature determined with this method is equivalent to that measured for bulk polystyrene films.
Citation
Polymer Engineering and Science
Volume
43
Issue
No. 6

Keywords

fluorescence, glass-transition temperature, ultra-thin polymer film

Citation

White, C. , Wu, W. , Pu, Y. , Rafallovich, M. and Sokolov, J. (2003), Probe Segregation and T-g Determination of a Supported Ultra-Thin Polystyrene Film Studied by X-Ray, Neutron Reflectivity, and SIMS, Polymer Engineering and Science, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851807 (Accessed March 3, 2024)
Created May 31, 2003, Updated October 12, 2021