White, C.
, Wu, W.
, Pu, Y.
, Rafallovich, M.
and Sokolov, J.
(2003),
Probe Segregation and T-g Determination of a Supported Ultra-Thin Polystyrene Film Studied by X-Ray, Neutron Reflectivity, and SIMS, Polymer Engineering and Science, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851807
(Accessed October 11, 2024)
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Probe Segregation and T-g Determination of a Supported Ultra-Thin Polystyrene Film Studied by X-Ray, Neutron Reflectivity, and SIMS
Published
Author(s)
, , Y Pu, M Rafallovich, J Sokolov
Abstract
Selective deuteration combined with X-ray and neutron reflectivity has been used to determine the extent of probe segregation to an interface in ultra-thin polymer films as a function of number of thermal cycles. Additional determination of the extent of probe segregation to an interface was shown with SIMS. Significant probe segregation was not evident in these studies. X-Ray reflectivity has also been employed to measure the coefficient of thermal expansion of ultra-thin polystyrene films supported on quartz. The glass transition temperature determined with this method is equivalent to that measured for bulk polystyrene films.Citation
Polymer Engineering and Science
Volume
43
Issue
No. 6
Pub Type
Journals
Download Paper
Keywords
fluorescence, glass-transition temperature, ultra-thin polymer film
Citation
Issues
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Created May 31, 2003, Updated October 12, 2021