PROBABILITY OF DETECTION OF X-RAY COMPUTED TOMOGRAPHY OF ADDITIVE MANUFACTURING DEFECTS

Published

July 19, 2019

Author(s)

Felix H. Kim, Adam L. Pintar, Jason C. Fox, Jared B. Tarr, M A. Donmez, Anne-Fran?oise Obaton

Abstract

A methodology to determine probability of detection (POD) of X-ray Computed Tomography (XCT) was developed using Additive Manufacturing defects. A signal response POD analysis (a^ vs a) was used, where both signal response (a^) and true defect size (a) were the volumes of the defects. The true defect size was measured with an optical measurement system, and the measurement uncertainty of the true defect size (a) was additionally incorporated into the POD analysis. An advanced XCT image analysis method was applied to determine volume of the defect to be used as signal response (a^). A statistical bootstrap algorithm was used to quantify uncertainty.

Proceedings Title

46th Annual Review of Progress in Quantitative Nondestructive Evaluation

Conference Dates

July 14-19, 2019

Conference Location

Portland, OR

Pub Type

Conferences

Download Paper

Local Download

Keywords

probability of detection, x-ray computed tomography, uncertainty

Citation

Kim, F. , Pintar, A. , Fox, J. , Tarr, J. , Donmez, M. and Obaton, A. (2019), PROBABILITY OF DETECTION OF X-RAY COMPUTED TOMOGRAPHY OF ADDITIVE MANUFACTURING DEFECTS, 46th Annual Review of Progress in Quantitative Nondestructive Evaluation, Portland, OR, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927902 (Accessed October 21, 2025)