NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Preoxidation as a general approach to suppressing orange-peel coupling in magnetic tunnel junctions

Published

Author(s)

William F. Egelhoff Jr., Robert McMichael, Cindi L. Dennis, Mark D. Stiles, Alexander J. Shapiro, Brian B. Maranville, Cedric J. Powell

Abstract

We have found that preoxidation of the bottom electrode prior to deposition of Al2O3 or MgO is very effective as a general approach to suppressing orange-peel coupling in magnetic tunnel junctions. When orange-peel coupling is suppressed, the hard-axis saturation field of the free layer is greatly reduced.
Citation
IEEE Transactions on Magnetics
Volume
42
Issue
10
Pub Type
Journals
Nanomagnetics

Citation

Egelhoff Jr., W. , McMichael, R. , Dennis, C. , Stiles, M. , Shapiro, A. , Maranville, B. and Powell, C. (2006), Preoxidation as a general approach to suppressing orange-peel coupling in magnetic tunnel junctions, IEEE Transactions on Magnetics (Accessed October 14, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created September 30, 2006, Updated October 12, 2021
Was this page helpful?