Huff, H.
, Richter, C.
, Green, M.
, Lucovsky, G.
and Hattori, T.
(1999),
preface to Ultrathin SiO<sub>2</sub> and High-K Materials for ULSI Gate Dielectrics, edited by H. R. Huff, C. A. Richter, M. L. Green, G. Lucovsky, and T. Hattori, Proc., Mater. Res. Soc. Symp. , Pittsburgh, PA, USA
(Accessed December 3, 2024)