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Precision X-Ray Spectroscopy at the NIST Electron-Beam Ion Trap: Resolution of Major Systematic Error
Published
Author(s)
T. Han, D J. Paterson, Lawrence T. Hudson, F Serpa, John D. Gillaspy, E Takacs
Abstract
Some of the most critical tests of the QED Lamb shifts are currently being pursued in the X-ray regime by investigating the core levels of medium Z atoms such as vanadium. The current approach to the measurement of the Lamb shift in such a system is outlined. We present major progress in understanding and reducing the systematic errors within our system. The error budget has been reduced to a level where critical tests of QED can be performed. Recent observations of Lyman α in hydrogenic vanadium at the NISt electron-Beam Ion Trap are presented.
Citation
Physica Scripta
Volume
T80
Pub Type
Journals
Keywords
electron bean ion trap (EBIT), highly charged ions, Lamb shift, quantumelectrodynamics (QED), x-ray spectroscopy
Citation
Han, T.
, Paterson, D.
, Hudson, L.
, Serpa, F.
, Gillaspy, J.
and Takacs, E.
(1999),
Precision X-Ray Spectroscopy at the NIST Electron-Beam Ion Trap: Resolution of Major Systematic Error, Physica Scripta
(Accessed October 12, 2025)