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Precision X-Ray Spectroscopy at the NIST Electron-Beam Ion Trap: Resolution of Major Systematic Error

Published

Author(s)

T. Han, D J. Paterson, Lawrence T. Hudson, F Serpa, John D. Gillaspy, E Takacs

Abstract

Some of the most critical tests of the QED Lamb shifts are currently being pursued in the X-ray regime by investigating the core levels of medium Z atoms such as vanadium. The current approach to the measurement of the Lamb shift in such a system is outlined. We present major progress in understanding and reducing the systematic errors within our system. The error budget has been reduced to a level where critical tests of QED can be performed. Recent observations of Lyman α in hydrogenic vanadium at the NISt electron-Beam Ion Trap are presented.
Citation
Physica Scripta
Volume
T80

Keywords

electron bean ion trap (EBIT), highly charged ions, Lamb shift, quantumelectrodynamics (QED), x-ray spectroscopy

Citation

Han, T. , Paterson, D. , Hudson, L. , Serpa, F. , Gillaspy, J. and Takacs, E. (1999), Precision X-Ray Spectroscopy at the NIST Electron-Beam Ion Trap: Resolution of Major Systematic Error, Physica Scripta (Accessed June 16, 2024)

Issues

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Created August 31, 1999, Updated October 12, 2021