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The potential of microcalorimeter x-ray spectrometers for measurement of relative fluorescence line intensities
Published
Author(s)
Joseph Fowler, Luis Miaja Avila, Galen O'Neil, Joel Ullom, Hope Whitelock, Daniel Swetz
Abstract
We have previously used an array of cryogenic microcalorimeters with 4 eV energy resolution to measure emission-line profiles and energies for the characteristic L-shell x rays of four elements of the lanthanide series: praseodymium, neodymium, terbium, and holmium. We consider the power of this same data set for the estimation of the lines' relative intensities. Intensities must be corrected for detector efficiency and self-absorption effects, and we estimate uncertainties on the corrections. These data represent the first use of cryogenic energy-dispersive sensors to estimate the relative intensities of x-ray fluorescence lines. They demonstrate that a targeted measurement of thin-film samples with microcalorimeter detectors could achieve systematic uncertainties below 1% on relative line intensities over a broad energy range.
Fowler, J.
, Miaja Avila, L.
, O'Neil, G.
, Ullom, J.
, Whitelock, H.
and Swetz, D.
(2022),
The potential of microcalorimeter x-ray spectrometers for measurement of relative fluorescence line intensities, Radiation Physics and Chemistry, [online], https://doi.org/10.1016/j.radphyschem.2022.110487, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=934471
(Accessed October 17, 2025)