Saito, T.
, Hughey, L.
, Proctor, J.
and And o'brian, T.
(1996),
Polarization Characteristics of Silicon Photodiodes and Its Dependence on Oxide Thickness in the Far UV Region,, Review of Scientific Instruments
(Accessed December 15, 2024)
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Polarization Characteristics of Silicon Photodiodes and Its Dependence on Oxide Thickness in the Far UV Region,
Published
Author(s)
T Saito, , , T R. And o'brian
Citation
Review of Scientific Instruments
Volume
67
Issue
9
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1995, Updated October 12, 2021