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Polarization Characteristics of Silicon Photodiodes and Its Dependence on Oxide Thickness in the Far UV Region,

Published

Author(s)

T Saito, L R. Hughey, James E. Proctor, T R. And o'brian
Citation
Review of Scientific Instruments
Volume
67
Issue
9

Citation

Saito, T. , Hughey, L. , Proctor, J. and And o'brian, T. (1996), Polarization Characteristics of Silicon Photodiodes and Its Dependence on Oxide Thickness in the Far UV Region,, Review of Scientific Instruments (Accessed December 1, 2024)

Issues

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Created December 31, 1995, Updated October 12, 2021