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Polarization Characteristics of Silicon Photodiodes and Its Dependence on Oxide Thickness in the Far UV Region,

Published

Author(s)

T Saito, L R. Hughey, James E. Proctor, T R. And o'brian
Citation
Review of Scientific Instruments
Volume
67
Issue
9

Citation

Saito, T. , Hughey, L. , Proctor, J. and And o'brian, T. (1996), Polarization Characteristics of Silicon Photodiodes and Its Dependence on Oxide Thickness in the Far UV Region,, Review of Scientific Instruments (Accessed April 19, 2024)
Created December 31, 1995, Updated October 12, 2021