Phase-slip lines as a resistance mechanism in transition-edge sensors

Published: January 27, 2014


Douglas A. Bennett, Daniel R. Schmidt, Daniel S. Swetz, Joel N. Ullom


The fundamental mechanism of resistance in voltage-biased superconducting films is poorly understood despite its importance as the basis of transition-edge sensors (TESs). TESs are utilized in state-of- the-art microbolometers and microcalorimeters covering a wide range of energies and applications. We present a model for the resistance of a TES based on phase-slip lines (PSLs) and compare the model to data. One of the model's predictions, discrete changes in the number of PSLs, is a possible explanation for the observed switching between discrete current states in localized regions of bias.
Citation: Physical Review Letters
Volume: 104
Issue: 4
Pub Type: Journals
Created January 27, 2014, Updated November 10, 2018