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Phase-Noise Measurement System for the Terahertz-Band

Published

Author(s)

Jason A. DeSalvo, Archita Hati, Craig W. Nelson, David A. Howe

Abstract

We present initial phase noise measurements in support of terahertz electronics, in the frequency range generally regarded as 0.1 to 10 THz. Using digital phase noise measurement techniques and an even-harmonic mixer, we achieve a phase noise measurement system in waveguide (WR1.5). At 670 GHz an upper bound of this system’s noise floor is found to be -20, -40, and -60 dBc/Hz at 1, 100, and 10000 Hz offsets, respectively. In addition a low phase noise 670 GHz source is measured at offset frequencies from 0.1 Hz to 1 MHz.
Citation
IEEE Transactions on Terahertz Science and Technology
Volume
2
Issue
6

Keywords

frequency control, harmonic mixers, metrology, phase noise, submillimeter wave measurements

Citation

DeSalvo, J. , Hati, A. , Nelson, C. and Howe, D. (2012), Phase-Noise Measurement System for the Terahertz-Band, IEEE Transactions on Terahertz Science and Technology (Accessed May 17, 2022)
Created November 30, 2012, Updated February 19, 2017