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Phase-Noise Measurement System for the Terahertz-Band
Published
Author(s)
Jason A. DeSalvo, Archita Hati, Craig W. Nelson, David A. Howe
Abstract
We present initial phase noise measurements in support of terahertz electronics, in the frequency range generally regarded as 0.1 to 10 THz. Using digital phase noise measurement techniques and an even-harmonic mixer, we achieve a phase noise measurement system in waveguide (WR1.5). At 670 GHz an upper bound of this systems noise floor is found to be -20, -40, and -60 dBc/Hz at 1, 100, and 10000 Hz offsets, respectively. In addition a low phase noise 670 GHz source is measured at offset frequencies from 0.1 Hz to 1 MHz.
Citation
IEEE Transactions on Terahertz Science and Technology
Volume
2
Issue
6
Pub Type
Journals
Keywords
frequency control, harmonic mixers, metrology, phase noise, submillimeter wave measurements
DeSalvo, J.
, Hati, A.
, Nelson, C.
and Howe, D.
(2012),
Phase-Noise Measurement System for the Terahertz-Band, IEEE Transactions on Terahertz Science and Technology
(Accessed June 8, 2023)