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Phase-Noise Measurement System for the Terahertz-Band



Jason A. DeSalvo, Archita Hati, Craig W. Nelson, David A. Howe


We present initial phase noise measurements in support of terahertz electronics, in the frequency range generally regarded as 0.1 to 10 THz. Using digital phase noise measurement techniques and an even-harmonic mixer, we achieve a phase noise measurement system in waveguide (WR1.5). At 670 GHz an upper bound of this system’s noise floor is found to be -20, -40, and -60 dBc/Hz at 1, 100, and 10000 Hz offsets, respectively. In addition a low phase noise 670 GHz source is measured at offset frequencies from 0.1 Hz to 1 MHz.
IEEE Transactions on Terahertz Science and Technology


frequency control, harmonic mixers, metrology, phase noise, submillimeter wave measurements


DeSalvo, J. , Hati, A. , Nelson, C. and Howe, D. (2012), Phase-Noise Measurement System for the Terahertz-Band, IEEE Transactions on Terahertz Science and Technology (Accessed June 15, 2024)


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Created November 30, 2012, Updated February 19, 2017