Rachakonda, P.
(2019),
Performance Characterization of Structured light 3D scanners for Industrial Metrology Applications, Proceedings of SPIE
(Accessed December 12, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Performance Characterization of Structured light 3D scanners for Industrial Metrology Applications
Published
Author(s)
Abstract
Structured light scanners have been commercially available for over a decade and some commercial scanners are evaluated using one of two German guidelines VDI/VDE 2634 parts 2 and/or 3. Several other research groups have developed physical artifacts that are agnostic to instrument construction and are purpose driven. The use of such guidelines and artifacts is not well understood for instruments which have a variety of sensor configurations and capabilities. It is also not clear if these guidelines/artifacts are sensitive to all the sources of errors that are present in these systems. In this context, this paper will describe the ongoing activities at NIST to study various sources of errors in structured light scanners with an objective of characterizing their performance.Citation
Proceedings of SPIE
Pub Type
Journals
Keywords
Dimensional metrology, 3d scanners, structured light, standardization
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created April 16, 2019, Updated September 27, 2019