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Path degeneracy and EXAFS analysis of disordered materials



Bruce D. Ravel


The analysis of EXAFS data measured on a material with a disordered local configuration environment around the absorbing atom can be challenging due to the proliferation of photoelectron scattering paths that must be considered in the analysis. In the case where the absorbing atom exists in multiple, inequivalent sites, the problem is compounded by having to consider each site separately. A method is proposed for automating the calculation of theory for inequivalent sites, then averaging the contributions from sufficiently similar scattering paths. With this approach, the complexity of implementing a successful fitting model on a highly disordered sample is reduced. As an example, an analysis of Ti K edge data on zirconolite, CaZrTi2O7, which has three inequivalent Ti sites, is presented.
Journal of Synchrotron Radiation


EXAFS, real space multiple scattering, data analysis


Ravel, B. (2014), Path degeneracy and EXAFS analysis of disordered materials, Journal of Synchrotron Radiation, [online], (Accessed June 16, 2024)


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Created October 24, 2014, Updated November 10, 2018