Mohan, K.
, Schaefer, A.
and Zalewski, E.
(1973),
Optical radiation measurements::stability and temperature characteristics of some silicon and selenium photodetectors, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.594-5
(Accessed July 26, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Optical radiation measurements::stability and temperature characteristics of some silicon and selenium photodetectors
Published
Author(s)
, ,
Citation
- NBS TN 594-5
Report Number
NBS TN 594-5
Pub Type
NIST Pubs
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1973, Updated May 19, 2023