Mohan, K.
, Schaefer, A.
and Zalewski, E.
(1973),
Optical radiation measurements::stability and temperature characteristics of some silicon and selenium photodetectors, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.594-5
(Accessed December 3, 2024)
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Optical radiation measurements::stability and temperature characteristics of some silicon and selenium photodetectors
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- NBS TN 594-5
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NBS TN 594-5
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NIST Pubs
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Created January 1, 1973, Updated May 19, 2023