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Optical Measurement Methods Applied to Process Control

Published

Author(s)

William R. Ott
Proceedings Title
National Laboratory Symposium on Optical Diagnostics in Manufacturing and Process Control
Conference Dates
December 2, 1993
Conference Location
Oak Ridge, TN
Conference Title
Proc. Joint Industry/National Laboratory Symposium on Optical Diagnostics in Manufacturing and Process Control

Citation

Ott, W. (1993), Optical Measurement Methods Applied to Process Control, National Laboratory Symposium on Optical Diagnostics in Manufacturing and Process Control , Oak Ridge, TN (Accessed April 18, 2024)
Created December 1, 1993, Updated February 17, 2017