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OOF: An Image-Based Finite Element Analysis of Material Microstructure
Published
Author(s)
Stephen A. Langer, W Carter, Lin-Sien H. Lum
Abstract
The determination of macroscopic properties of a material given its microscopic structure is of fundamental importance to materials science. We present an overview of two public domain programs which jointly predict macroscopic behavior, starting from an image of the microsctructure and ending with results from finite element calculations. The first program reads an image and assigns material properties to microscopic features. The second program reads the output of the first and performs virtual tests to deduce macroscopic behavior.
Langer, S.
, Carter, W.
and Lum, L.
(2001),
OOF: An Image-Based Finite Element Analysis of Material Microstructure, IEEE Computing in Science and Engineering
(Accessed December 10, 2023)